Published
2000 by Springer in London, New York .
Written in
Edition Notes
Includes bibliographical references (p. [175]-187) and index.
| Statement | Evan Russell, Leo H. Chiang and Richard D. Braatz. |
| Series | Advances in industrial control |
| Contributions | Chiang, Leo H., 1975-, Braatz, Richard D., 1966- |
| Classifications | |
|---|---|
| LC Classifications | TP155.75 .R87 2000, TP155.75 .R87 2000 |
| The Physical Object | |
| Pagination | xiii, 192 p. : |
| Number of Pages | 192 |
| ID Numbers | |
| Open Library | OL17716387M |
| ISBN 10 | 1852332581 |
| LC Control Number | 00027317 |
Data-driven methods for fault detection and diagnosis in chemical processes have become increasingly important in recent years. One noteworthy book on this topic is "Data-driven methods for fault detection and diagnosis in chemical processes" by Evan Russell, published in 2000.
This book provides a comprehensive overview of data-driven methods for fault detection and diagnosis in chemical processes. It covers various techniques and approaches that can be used to analyze and diagnose faults in chemical processes, making it a valuable resource for engineers, researchers, and students in the field.
ISBN-10: 1852332581
The book covers the following subjects:
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